DC Parametric Test
IV, CV, pulsed, leakage, breakdown, reliability, and low-frequency noise measurements.
WaferGrid Technologies Pte Ltd | Semiconductor Test & Measurement
Applications
WaferGrid Technologies Pte Ltd helps reduce uncertainty in measurements where every contact, cable, thermal transition, and calibration step matters.
IV, CV, pulsed, leakage, breakdown, reliability, and low-frequency noise measurements.
Optical alignment, grating coupling, photodiode, modulator, and co-packaged optics tests.
Cryogenic screening and correlation workflows for qubit structures and control devices.
High-current and high-voltage wafer probing for GaN, SiC, and advanced power ICs.