Products

Probe Cards

Custom probe-card technologies that help high-volume manufacturers reduce cost of test and protect yield learning.

HomeProbe Cards

Probe Card Applications

WaferGrid Technologies Pte Ltd designs application-specific contactors and probe cards for advanced nodes, mature nodes, and specialty devices.

Logic and SoC

Fine-pitch, high-parallelism cards for processors, controllers, and advanced packaging.

DRAM and Flash

Memory probe cards optimized for parallelism, lifetime, repairability, and stable contact resistance.

RF Front End

Production RF probe cards for filters, switches, PAs, antenna modules, and radar devices.

Optical and Parametric

Illuminated, low-noise, and precision cards for image sensors, LEDs, and process monitor structures.

Engineering Collaboration

Probe-card programs begin with pad layout, tester interface, operating temperature, lifetime targets, and service strategy. WaferGrid Technologies Pte Ltd then builds a verified route from design review to manufacturing release.

Design-for-test review and pad-contact risk assessment.
Prototype builds, correlation, and production release documentation.
Repair, cleaning, and lifecycle management programs.